▪ Reflection can be minimized by the low-angle, dark-field lighting configuration.
▪ Ideal for imaging of uneven surfaces such as embossment and surface flaw detection.
• Substrate and PCB positioning
• Chip component inspection
• LCD alignment
• Label inspection
• Plastic container inspection
• Mounter
• IC marking inspection, etc.
Chamfer Checking on Metal Ring | 12-Pin Connector |
MORITEX North America, Inc. California office
Add:6862 Santa Teresa Blvd. San Jose, CA 95119 U.S.A.
Tel:+1-408-363-2100
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