▪ Diffused illumination from a shallow angle is suited for scratch and edge detection on glossy surfaces.
• IC marking inspection, inspection of components on PCBs
• Dirt inspection of the sides and insides of caps
• Wafer surface inspection
• Solder inspection and connector pitch inspection
• Inspection of BGA, QFP, etc.
D-sub connectors |
Can bottoms |
Can bottoms |
MORITEX North America, Inc. California office
Add:6862 Santa Teresa Blvd. San Jose, CA 95119 U.S.A.
Tel:+1-408-363-2100
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