• Observation of images that are not visible • Void inspections • SAW filter (LiNbO3 LiTaO3) inspections • MEMS inspections • Wafer on wafer positioning • FCB positioning • Image recognition through film • Wiring recognition on TAB circuit boards • Wafer surface observation/ OCR • Infrared microscope lighting
* Lamps other than compatible lamps cannot be used.
MORITEX North America, Inc. California office
Add:6862 Santa Teresa Blvd. San Jose, CA 95119 U.S.A.
Tel:+1-408-363-2100
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