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Microscopic

MOL10-03012HR-38MA

▪ High-precision objective lens for semiconductor wafer inspection
▪ Field Number: 38mm
MOL10-03012HR-38MA
Download DataTechnical DatasheetDrawing Data Drawing Data（STEP）
Main Applications
High-precision semiconductor wafer inspection


Specifications
  • Spec
  • MOL10-03012HR-38MA
  • Focal Length
  • 20
  • NA
  • 0.3
  • WD (mm)
  • 11.5
  • Parfocal Length(mm)
  • 120
  • Resolution (μm)*1
  • 1.1
  • Field Number(mm)
  • 38
  • Mount
  • W26
  • Spec with SOD-200-40M58
  • Magnification (x)
  • 10
  • Effective Fno
  • 16.41
  • O/I (mm)
  • 410.1
  • Depth of Field (mm)*2
  • 0.007
  • Mount
  • M58,F,C
*1 Resolution without differential interference contrast.(@λ=550nm)
*2 Depth of field is calculated with a permissible circle of confusion diameter of φ20um


External View
Contact Information

MORITEX North America, Inc.

Add：20380 Town Center Lane, Suite 215 Cupertino, CA 95014 USA.

E-mail：sales.china@cognex.com

Tel：+1-408-363-2100

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